The VNA-spectrum analyzer solution is ideal for on-wafer measurements, as it leverages VectorStar’s inherent advantages of making a direct connection to an on-wafer device. It allows engineers to analyze VNA-like and spectrum-analyzer-like response of a device under test (DUT). Spectral domain measurements of harmonics, spurious, other distortion products, and general frequency content can be made effectively with the single-instrument solution. Simultaneous, sequential S-parameter and spectrum analysis are possible with the VNA-spectrum analyzer instrument. It is particularly beneficial for applications involving mixers and amplifiers, including those with multiple outputs or input-output comparisons. Integrating VNA/spectrum analyzer capability provides engineers with an innovative method to quickly transfer a challenging VNA measurement to the spectrum analyzer – without changing the test setup or using multiple instruments. The spectrum analyzer option is compatible with all baseband VectorStar models – broadband and banded system configurations.
With the spectrum analyzer option installed, VectorStar can conduct single connection VNA and spectrum-based measurements to create a more efficient and accurate testing environment to verify active and passive devices during the design, troubleshooting, or characterization stages. Anritsu Company enhances its VectorStar™ vector network analyzer (VNA) family with comprehensive spectrum analysis capability to create the world’s first single sweep VNA-spectrum analyzer solution that supports 70 kHz to 220 GHz.
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